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ThinkMind // VALID 2011, The Third International Conference on Advances in System Testing and Validation Lifecycle // View article valid_2011_5_40_40074


Software Testing in Critical Embedded Systems: a Systematic Review of Adherence to the DO-178B Standard

Authors:
Jacson Rodrigues Barbosa
Márcio Eduardo Delamaro
José Carlos Maldonado
Auri Marcelo Rizzo Vincenzi

Keywords: software testing; critical embedded system; DO-178B

Abstract:
Computing is becoming increasingly critical as far as embedded applications are concerned. Depending on the software, its malfunction may have consequences varying from serious financial problems to the loss of human lives. In view of this, this paper presents a systematic review that investigates the evolution of the work-related activity of embedded software critical tests in order to assess the level of compliance of the works found in relation to the DO-178B standard (Software Considerations in Airborne Systems and Equipment Certification). The ultimate goal of this research is the composition of existing works to define a test process that incorporates the quality and DO-178B requirements considering the different levels of criticality.

Pages: 126 to 130

Copyright: Copyright (c) IARIA, 2011

Publication date: October 23, 2011

Published in: conference

ISSN: 2308-4316

ISBN: 978-1-61208-168-7

Location: Barcelona, Spain

Dates: from October 23, 2011 to October 29, 2011

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