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ThinkMind // VALID 2013, The Fifth International Conference on Advances in System Testing and Validation Lifecycle

Type: conference

Download: VALID 2013 cover page

Download: VALID 2013 foreword page

Download: VALID 2013 committee page

Download: VALID 2013 table of contents

Download: VALID 2013 full proceedings

Notes: IARIA Conference.

Editors:
Jos van Rooyen, Bartosz, the Netherlands
Philipp Helle, EADS Innovation Works, Germany
Pascal Lorenz, University on Haute Alsace, France

Event editions: - there are 11 editions.

ISSN: 2308-4316

ISBN: 978-1-61208-307-0

Location: Venice, Italy

Dates: from October 27, 2013 to October 31, 2013

Articles: there are 12 articles

Model-Based MCDC Testing of Complex Decisions for the Java Card Applet Firewall
Roderick Bloem, Karin Greimel, Robert Koenighofer, and Franz Roeck
keywords: automatic test case generation; common criteria; java card applet firewall

Enabling Interface Validation through Text Generation
Håkan Burden, Rogardt Heldal, and Peter Ljunglöf
keywords: Natural language processing, Reverse engineering, Software components;

Efficient Elimination of False Positives Using Bounded Model Checking
Tukaram Muske, Advaita Datar, Mayur Khanzode, and Kumar Madhukar
keywords: Abstract Interpretation; Model Checking; False Positives Elimination, Data Flow Analysis

State Space Reconstruction for On-Line Model Checking with UPPAAL
Jonas Rinast, Sibylle Schupp, and Dieter Gollmann
keywords: State Space Reconstruction; On-line Model Checking; UPPAAL

Formal Composition based on Roles within a Model Driven Engineering Approach
Cédrick Lelionnais, Jérôme Delatour, Matthias Brun, Olivier H. Roux, and Charlotte Seidner
keywords: Model Driven Engineering, Real-time operating sys- tems, Behavioral modeling, Transformation, Verification, Time Petri Nets, Application deployment

Preliminary Test Suite Reduction
Vitaly Kozyura and Sebastian Wieczorek
keywords: MBT; test suite reduction; industrial case study

Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive Defects
João Azevedo, Arnaud Virazel, Yuanqing Cheng, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, and Jeremy Alvarez Herault
keywords: non-volatile memories; spintronics; TAS-MRAM; capacitive defects; fault modeling; test.

Automatic Linking of Test Cases and Requirements
Thomas Noack
keywords: Reuse, Requirements, Test cases, IBM DOORS

Using Filtering to Improve Value-Level Debugging of Verilog Designs
Bernhard Peischl, Naveed Riaz, and Franz Wotawa
keywords: hardware/software debugging, model-based debugging, source-level debugging, fault localisation

Towards an Integrated Methodology for the Development and Testing of Complex Systems
Philipp Helle and Wladimir Schamai
keywords: Model-based Systems Engineering, Model-based Testing, Monitor-based Testing, SysML

An Evaluation of Client-Side Dependencies of Search Engines by Load Testing
Emine Sefer and Sinem Aykanat
keywords: search engine; load testing; Internet browser; network bandwidth.

Compact Traceable Logging
Wishnu Prasetya, Ales Sturala, Arie Middelkoop, Jurriaan Hage, and Alexander Elyasov
keywords: logging; logging; software tracing; tracing

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