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ThinkMind // VALID 2017, The Ninth International Conference on Advances in System Testing and Validation Lifecycle

Type: conference

Download: VALID 2017 cover page

Download: VALID 2017 foreword page

Download: VALID 2017 committee page

Download: VALID 2017 table of contents

Download: VALID 2017 full proceedings

Notes: IARIA Conference.

Editors:
Xinli Gu, Huawei Technologies Co., Ltd., USA
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Claus-Peter Rückemann, Leibniz Universität Hannover / Westfälische Wilhelms-Universität Münster / North-German Supercomputing Alliance (HLRN), Germany

Event editions: - there are 11 editions.

ISSN: 2308-4316

ISBN: 978-1-61208-593-7

Location: Athens, Greece

Dates: from October 8, 2017 to October 12, 2017

Articles: there are 3 articles

A Method to Determine the Static NBTI Stress Time of an Embedded Component in an Integrated Circuit
Puneet Ramesh Savanur and Spyros Tragoudas
keywords: Negative bias temperature instability (NBTI); counterfeit; aging; odometer; built-in self-test (BIST)

Application of Extended Timed Automata to Automotive Integration Testing
Jan Sobotka and Jiří Novák
keywords: Model-Based; Integration; Testing; Timed; Automaton; Automotive; ECU

Improvement of Sequential Tests in IEC-61124 Reliability Testing – Compliance Tests for Constant Failure Rate
Ofer Shaham and Yefim Haim Michlin
keywords: Exponential distribution; compliance; mass-production; reliability; sequential probability ratio test.

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